Overview of coherent reflectometry techniques: characterization of components and small systems,
M Wegmuller, P Oberson, J P von der Weid, O Guinnard, L Guinnard, C Vinegoni, M Legre, N Gisin,
Technical Digest Symposium on Optical Fiber Measurements, 2000 (NIST SP 953)|Technical Digest Symposium on Optical Fiber Measurements, 2000 (NIST SP 953) , 155--60|viii+189 (2000)